About this role
Role Type: Contractor
Location: Remote
micro1 is engaging Semiconductor Yield / Defect Engineers (Wafer Fab, SEM Defect Review) to support a customer engagement focused on advancing semiconductor manufacturing analytics. In this role, you'll apply your expertise to help train next-generation AI systems. Your work will shape how models learn, reason, and perform through high-quality, real-world input. No prior experience in AI is required — your domain knowledge is what matters. This opportunity is ideal for yield, defect, or process integration experts with direct hands-on experience in wafer fab production environments, especially those familiar with facilities operating their own sort floors. Retired or former fab engineers are highly encouraged to participate and share their invaluable experience.
Scope of Work
- Conduct SEM (Scanning Electron Microscope) defect review and accurate classification of defects observed in wafer fabrication processes.
- Interpret and analyze yield loss mechanisms, correlating defect patterns with process-related issues.
- Evaluate excursion events and make informed lot-hold or release recommendations based on empirical evidence and industry best practices.
- Review, interpret, and annotate wafer sort and test floor data, including bin maps and parametric datasets.
- Identify defect paretos and contribute to source attribution analysis to trace root causes.
- Document observations, communicate technical findings, and provide actionable feedback in clear, concise written and verbal formats for integration into AI learning modules.
Preferred Qualifications
- Extensive hands-on experience in wafer fab environments, with a focus on SEM-based defect review and yield analysis.